Texas Instruments TPS7H6003EVM-CVAL Evaluation Module
Texas Instruments TPS7H6003EVM-CVAL Evaluation Module accepts up to a 150V input, allowing users to test the reliability of the TPS7H6003-SP by driving the EPC2307. The TI TPS7H6003EVM-CVAL evaluation module is set up to operate the TPS7H6003-SP in PWM mode by default. The TPS7H6003-SP then receives an input of one switching signal and internally develops a complementary signal. This feature can be changed to the IIM mode, in which the two outputs work independently of one another.
Features
- Selectable input interlock protection in independent input mode
- Split outputs for adjustable turn-on and turn-off times
- 25ns typical propagation delay in independent input mode
- 1.5A peak source, 3A peak sink current
- Up to 150V operation on the PVIN input
- PWM and IIM modes supported
- Large pads to place own inductors and capacitors
- Integrated dead time for PWM mode
Applications
- Communications payload
- Command and data handling
- Satellite electrical power system
- Space satellite point of load supply for FPGA core voltage rails
Layout
Associated EVMs
Texas Instruments TPS7H60x5EVM Evaluation Modules
Designed to quickly and easily demonstrate the TPS7H60x5-SEP gate drivers.
Texas Instruments TPS7H6013EVM-CVAL Gate Driver Evaluation Module
Evaluates the TPS7H6013-SP device, a radiation-hardened, QMLV 60V half-bridge GaN gate driver.
Texas Instruments TPS7H6023EVM-CVAL Driver Evaluation Module
Tests and evaluates the TPS7H6023-SP, a radiation-hardened 22V half-bridge GaN gate driver.
Đã phát hành: 2023-08-11
| Đã cập nhật: 2024-09-12